DocumentCode
2862783
Title
Investigation on the sensitivity of TiO2 : Ru pH sensor by Taguchi design of experiment
Author
Yang, Shu-Ying ; Chen, Cheng-Wei ; Chou, Jung-Chuan
Author_Institution
Dept. of Inf. Manage., Fortune Inst. of Technol., Kaohsiung, Taiwan
fYear
2011
fDate
21-24 June 2011
Firstpage
1
Lastpage
2
Abstract
The ruthenium-doped titanium dioxide (TiO2:Ru) sensing films were deposited on silicon substrates by sputtering and applied in pH sensors based on separative extended-gate field effect transistor (SEGFET). The Taguchi method with L18 (21×37) orthogonal arrays and signal-to-noise (S/N) ratio were employed to study the performance characteristics. It was evaluated in terms of sensitivity to determine the optimal combination of the parameters. After Taguchi analysis, heat treatment temperature and annealed time were the most influencing parameters on the sensitivity of pH sensor. After verification of the experiments, the sensitivity of pH sensor is high (56.1~60.9 mV/pH, satisfy Nernstian response), stable (0.9987). Heat treatment temperature is controlled about 400°C can reach Nernstian response. Furthermore, super-Nernstian response could be attained when the temperature is controlled about 600°C.
Keywords
Taguchi methods; annealing; chemical sensors; design of experiments; field effect transistors; pH measurement; ruthenium; semiconductor doping; semiconductor thin films; sensitivity analysis; sputtering; titanium compounds; S/N ratio; SEGFET; Taguchi analysis; Taguchi design of experiment; Taguchi method; TiO2:Ru; annealed time; heat treatment temperature; orthogonal array; pH sensor; ruthenium-doped titanium dioxide; sensing film; sensitivity; separative extended-gate field effect transistor; signal-to-noise ratio; silicon substrate; sputtering; super-Nernstian response; Films; Heat treatment; Pollution measurement; Sensitivity; Temperature; Temperature sensors; Ruthenium-doped titanium dioxide; Separative extended-gate field effect transistor; Super-Nernstian response; Taguchi method; pH sensor;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2011 IEEE 4th International
Conference_Location
Tao-Yuan
ISSN
2159-3523
Print_ISBN
978-1-4577-0379-9
Electronic_ISBN
2159-3523
Type
conf
DOI
10.1109/INEC.2011.5991756
Filename
5991756
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