DocumentCode
2863059
Title
Fully ion implanted 4096-bit high speed DSA MOS RAM
Author
Shimotori, K. ; Anami, K. ; Nagayama, Y. ; Okhura, I. ; Ohmori, Masato ; Nakano, T. ; Hayashi, Yasuhiro ; Tarui, Yoichiro
Author_Institution
Mitsubishi Electric Corp., Hyogo, Japan
Volume
XX
fYear
1977
fDate
16-18 Feb. 1977
Firstpage
76
Lastpage
77
Keywords
Capacitance; Electric variables; FETs; Inverters; Ion implantation; Power dissipation; Propagation delay; Solid state circuits; Threshold voltage; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1977.1155678
Filename
1155678
Link To Document