• DocumentCode
    2863243
  • Title

    A unique art purifying the atomic scale, zone selective, and quantitative information of bonding and electronic dynamics at sites surrounding defects, surfaces, and interfaces

  • Author

    Nie, Yanguang ; Pan, Jisheng ; Sun, Chang Q.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2011
  • fDate
    21-24 June 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    With the theory enabled technology, we have been able to purify information from zones up to two atomic spacings regarding the evolution of the bond length, bond strength, energy density, and the energetic behavior of the localized core and valence electrons by filtering out the bulk and background information, which enabled us to identify the direction of charge flow in the catalytic reactions between the gaseous specimens and the Rh and Pt adatoms catalysts, and between the gaseous specimens and the CuPd and AgPd nanoalloys. With the special technique, we have also been able to clarify that the Dirac-Fermi polarons detected using STM/S as high protrusions with resonance at Fermi energy as arising from the polarization of the unpaired dangling-bond electrons by the undercoordination-induced local densification and quantum entrapment of the energetically low-lying electrons, which in turn screen and split the crystal potential adding another extra component in the upper edge of the core band.
  • Keywords
    Fermi level; bond lengths; dangling bonds; Dirac-Fermi polarons; Fermi energy; atomic scale; atomic spacings; bond length; bond strength; dangling-bond electrons; electronic dynamics; energetic behavior; energetically low-lying electrons; energy density; localized core; nanoalloys; quantitative information; quantum entrapment; valence electrons; zone selective; Bonding; Filtering; Industries; Materials; Metals; Monitoring; Sun;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2011 IEEE 4th International
  • Conference_Location
    Tao-Yuan
  • ISSN
    2159-3523
  • Print_ISBN
    978-1-4577-0379-9
  • Electronic_ISBN
    2159-3523
  • Type

    conf

  • DOI
    10.1109/INEC.2011.5991783
  • Filename
    5991783