Self-diffraction SPIDER

Author

Birkholz, Simon ; Bethge, Jens ; Grebing, Christian ; Koke, Sebastian ; Steinmeyer, Günter

Author_Institution

Max Born Inst., Berlin, Germany

fYear

2009

fDate

14-19 June 2009

Firstpage

1

Lastpage

1

Abstract

The work investigates the much more broadband self-diffraction (SD) process as an alternative for SPIDER (spectral phase interferometry for direct electric field reconstruction) pulse characterization. To the best of the authors´ knowledge, this constitutes the first experimental demonstration of a chi⁽³⁾ based SPIDER apparatus. For a first experimental demonstration, SD SPIDER setup is employed to characterize amplified pulses from a Ti:sapphire laser with about 20 fs pulse duration.

Keywords

laser beams; laser variables measurement; light diffraction; light interferometry; nonlinear optical susceptibility; optical pulse generation; pulse measurement; Al₂O₃:Ti; Ti:sapphire laser; pulse characterization; self-diffraction SPIDER; spectral phase interferometry for direct electric field reconstruction; Bandwidth; Frequency conversion; Nonlinear optics; Optical frequency conversion; Optical harmonic generation; Optical mixing; Optical pulses; Phase measurement; Pulse amplifiers; Pulse measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on

Conference_Location

Munich

Print_ISBN

978-1-4244-4079-5

Electronic_ISBN

978-1-4244-4080-1

Type

conf

DOI

10.1109/CLEOE-EQEC.2009.5196394

Filename

5196394