• DocumentCode
    2863787
  • Title

    Session 13 overview MOS sampled data signal processing

  • Author

    Hewes, C.

  • Author_Institution
    Texas Instruments, Inc., Dallas, TX, USA
  • Volume
    XX
  • fYear
    1977
  • fDate
    16-18 Feb. 1977
  • Firstpage
    147
  • Lastpage
    147
  • Abstract
    Presents a synopsis of the sessions held at the conference proceedings.
  • Keywords
    MOS sampled data signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1977.1155721
  • Filename
    1155721
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2863787