Field theory analysis of electromagnetic field scattering at coplanar waveguide MIS discontinuities

Author

Shuoqi Chen ; Vahldieck, R. ; Jifu Huang

Author_Institution

Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada

Volume

3

fYear

1996

fDate

21-26 July 1996

Firstpage

2000

Abstract

This paper presents a rigorous field theory analysis of electromagnetic held scattering at discontinuities in semiconductor based coplanar waveguide (CPW) metal-insulator-semiconductor (MIS) transmission lines with laterally confined doping profile. Two types of the CPW MIS discontinuity structures are investigated: (a) a CPW through line with an abrupt transition from undoped to doped substrate and (b) the same as (a) but with an additional strip discontinuity of the CPW. The characterization of both types of discontinuites is important for application of CPW MIS slow-wave structures.

Keywords

MIS devices; MIS structures; coplanar waveguides; doping profiles; electromagnetic field theory; electromagnetic wave scattering; semiconductor doping; slow wave structures; waveguide discontinuities; CPW MIS discontinuity structures; CPW MIS slow-wave structures; MIS transmission lines; abrupt transition; coplanar waveguide MIS discontinuities; doped substrate; electromagnetic field scattering; field theory analysis; laterally confined doping profile; metal-insulator-semiconductor transmission lines; semiconductor based coplanar waveguide; strip discontinuity; undoped substrate; Coplanar waveguides; Electromagnetic analysis; Electromagnetic fields; Electromagnetic scattering; Electromagnetic waveguides; Metal-insulator structures; Semiconductor waveguides; Transmission line discontinuities; Waveguide discontinuities; Waveguide theory;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 1996. AP-S. Digest

Conference_Location

Baltimore, MD, USA

Print_ISBN

0-7803-3216-4

Type

conf

DOI

10.1109/APS.1996.549999

Filename

549999