DocumentCode
2864046
Title
Control of Analogue Scan Probe in CMM Inspect of Spiral Bevel Gear
Author
Weimin, Pan ; Yi, Lei ; Jishun, Li
Author_Institution
Sch. of Mech. Eng. & Autom., Beihang Univ., Beijing
fYear
2006
fDate
25-28 June 2006
Firstpage
79
Lastpage
83
Abstract
In the context of three-dimensional 3D coordinate metrology, CMM (coordinate measuring machine) have been widely adopted as general-purpose tools that have the capability of inspecting various mechanical components having complex topology and geometry. The recent developments in spiral bevel gears (SBGs) manufacturing system have made the traditional dimensional inspections bottlenecks in the production line. To overcome these bottlenecks, computer integrated dimensional inspection was proposed with the CMM being the key device. In this investigation, a framework for integrating the CMM into CAD/CAM environment is developed. In order to achieve a higher level of automation, CAD-directed inspection planning is essential. First of all, due to the distinct characteristics of various probes in terms of resolutions, digitizing speed and spatial range, The CMM probes have to be selected and controlled properly. A motorized head gives a DCC CMM the added capability of probe reorientation, allowing the probe to inspect features at the optimum angle, considering access requirements and probing best practice. An algorithm to generate an optimized control of analogue scan probe in CMM inspect of spiral bevel gear is proposed. The proposed algorithm is implemented using PC-DMIS as the CMM software system and PH10M+SP600M as the analogue scan probe system. The effectiveness of the proposed algorithm is verified by the results of the implementation
Keywords
CAD/CAM; computer integrated manufacturing; coordinate measuring machines; gears; inspection; CAD-directed inspection planning; analogue scan probe; computer integrated dimensional inspection; coordinate measuring machine; manufacturing system; spiral bevel gear; Coordinate measuring machines; Gears; Geometry; Inspection; Manufacturing systems; Metrology; Probes; Production systems; Spirals; Topology; Analogue Scan Probe; CMM; Spiral Bevel Gear;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronics and Automation, Proceedings of the 2006 IEEE International Conference on
Conference_Location
Luoyang, Henan
Print_ISBN
1-4244-0465-7
Electronic_ISBN
1-4244-0466-5
Type
conf
DOI
10.1109/ICMA.2006.257456
Filename
4026059
Link To Document