DocumentCode :
2864126
Title :
Using near field probes to observe class E waveforms in HF/VHF/UHF power amplifiers
Author :
Mediano, Arturo
Author_Institution :
Aragon Institute for Engineering Research (I3A), University of Zaragoza, 50018, Spain
fYear :
2012
fDate :
17-22 June 2012
Firstpage :
1
Lastpage :
3
Abstract :
Class E amplifiers were introduced by N.O. Sokal and A. D. Sokal in the 70s [1] and, since then, numerous applications where higher efficiency was one of the key issues have been presented.
Keywords :
Documentation; Loading; Power amplifiers; Probes; Transistors; UHF measurements; Voltage measurement; Class E; Drain waveform; Near Field probe; Power Amplifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
ISSN :
0149-645X
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2012.6259450
Filename :
6259450
Link To Document :
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