DocumentCode
2864136
Title
A technique for electrically measuring the thermal resistance of GaAs bulk resistors
Author
Sabin, Edwin ; Scarpulla, John ; Chou, Yeong-Chang ; Shimamoto, Gene
Author_Institution
TRW Inc., Redondo Beach, CA, USA
fYear
2000
fDate
2000
Firstpage
65
Lastpage
69
Abstract
An electrical technique to measure the thermal resistance of GaAs bulk resistors is presented. The thermal resistance of several resistors was determined. The difference in these results relative to a liquid crystal method is discussed. Then, the reliability impact on the resistors from self-heating is studied
Keywords
III-V semiconductors; gallium arsenide; resistors; semiconductor device reliability; thermal resistance; thermal resistance measurement; GaAs; Seebeck effect; bulk resistors; reliability; self-heating; thermal resistance measurement; Current measurement; Electric resistance; Electric variables measurement; Electrical resistance measurement; Gallium arsenide; Geometry; Liquid crystals; Resistors; Temperature measurement; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
GaAs Reliability Workshop, 2000. Proceedings
Conference_Location
Seattle, WA
Print_ISBN
0-7908-0102-7
Type
conf
DOI
10.1109/GAASRW.2000.902421
Filename
902421
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