DocumentCode :
2864526
Title :
A conditional-reliability control-chart for the post-production extended reliability-test
Author :
Sun, Feng-Bin ; Yang, Jimmy ; Rosario, Ramon Del ; Murphy, Richard
Author_Institution :
Quantum Corp., Milpitas, CA, USA
fYear :
2001
fDate :
2001
Firstpage :
64
Lastpage :
69
Abstract :
This paper presents a new failure-percent control chart which is based on the conditional reliability of the sequential life tests. It provides a better reliability monitoring tool than the existing SPRT chart because: (1) the new control chart calculates and plots the failure percent batch by batch separately without mixing them and accumulating run hours and number of failures across batches, and therefore provides higher sensitivity of catching manufacturing aberration; (2) the new control chart does not assume a constant failure rate; (3) no assumption needs to be made on the population homogeneity; and (4) it is easier to trace back to the troublemaking batch, fix the problem and conduct more in-depth risk assessment. It is also found the proposed monitoring tool is not sensitive to the Weibull shape parameter selection in its actual feasible range
Keywords :
failure analysis; production; quality control; reliability; testing; Weibull shape parameter selection; conditional reliability; conditional-reliability control-chart; failure percent; failure rate; failure-percent control chart; in-depth risk assessment; manufacturing aberration; population homogeneity; post-production extended reliability-test; reliability monitoring tool; sequential life tests; troublemaking batch; Acoustic testing; Condition monitoring; Control charts; Hard disks; Life estimation; Life testing; Manufacturing; Quantum computing; Sequential analysis; Sun;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2001. Proceedings. Annual
Conference_Location :
Philadelphia, PA
ISSN :
0149-144X
Print_ISBN :
0-7803-6615-8
Type :
conf
DOI :
10.1109/RAMS.2001.902443
Filename :
902443
Link To Document :
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