• DocumentCode
    2865258
  • Title

    A V-band low-noise amplifier with 5.3-dB NF and over 8-kV ESD protection in 65-nm RF CMOS

  • Author

    Tsai, Ming-Hsien ; Hsu, Shawn S H ; Yeh, Tzu-Jin ; Jou, Chewn-Pu ; Hsueh, Fu-Lung

  • Author_Institution
    Dept. of Electrical Engineering and Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan
  • fYear
    2012
  • fDate
    17-22 June 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper presents an ESD-protected V-band (f0 at 58 GHz) low-noise amplifier (LNA) in 65-nm CMOS. Instead of using the conventional diode-based RF ESD design, a high current capability spiral inductor and a high breakdown MOM capacitor are employed as effective bi-directional ESD protection network, and also as part of the input matching by the co-design approach. The measured results demonstrate an over 8-kV HBM ESD protection level with a NF of 5.3 dB and a power gain of 17.5 dB at 58 GHz, under a power consumption of 18 mW. To our best knowledge, this LNA presents a highest ESD protection level and a lowest NF, compared with prior arts in a similar frequency range.
  • Keywords
    CMOS integrated circuits; Electrostatic discharges; Gain; Low-noise amplifiers; Noise; Noise measurement; Radio frequency; CMOS; electrostatic discharge (ESD); low-noise amplifier (LNA); millimeter wave (mm-Wave);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
  • Conference_Location
    Montreal, QC, Canada
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-1085-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2012.6259515
  • Filename
    6259515