Title :
Dynamic depletion mode: An E/D MOSFET circuit method
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Abstract :
This paper will describe the dynamic use of depletion-mode devices resulting in improved performance in MOSFET enhancement/depletion circuits. The method - DDM - applies to the design of logic, memory and driver circuits.
Keywords :
Capacitance; Circuit testing; Delay effects; Distributed decision making; Driver circuits; Logic circuits; Logic devices; MOSFET circuits; Pulse circuits; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1978.1155811
