• DocumentCode
    2865295
  • Title

    Buried injector logic: Second generation I2L performance

  • Author

    Yiannoulos, A.

  • Author_Institution
    Bell Laboratories, Reading, PA, USA
  • Volume
    XXI
  • fYear
    1978
  • fDate
    15-17 Feb. 1978
  • Firstpage
    12
  • Lastpage
    13
  • Abstract
    A vertically structured I2L gate, integrated with linear SBC processing, will be discussed. Previous (standard I2L) logic/linear function conflicts stemming from structural constraints have been reconciled, demonstrating second generation I2L performance with unrestrained SBC capability.
  • Keywords
    Circuit testing; Counting circuits; Epitaxial growth; Implants; Logic circuits; Logic devices; Logic testing; Rails; Solid state circuits; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1978.1155812
  • Filename
    1155812
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2865295