DocumentCode :
2865937
Title :
Semi-supervised clustering with metric learning using relative comparisons
Author :
Kumar, Nimit ; Kummamuru, Krishna ; Paranjpe, Deepa
Author_Institution :
Indian Inst. of Technol., IBM India Res. Lab, New Delhi, India
fYear :
2005
fDate :
27-30 Nov. 2005
Abstract :
Semi-supervised clustering algorithms partition a given data set using limited supervision from the user. In this paper, we propose a clustering algorithm that uses supervision in terms of relative comparisons, viz., x is closer to y than to z. The success of a clustering algorithm also depends on the kind of dissimilarity measure. The proposed clustering algorithm learns the underlying dissimilarity measure while finding compact clusters in the given data set. Through our experimental studies on high-dimensional textual data sets, we demonstrate that the proposed algorithm achieves higher accuracy than the algorithms using pair-wise constraints for supervision.
Keywords :
learning (artificial intelligence); pattern clustering; clustering algorithm; dissimilarity measure; metric learning; relative comparison; semisupervised clustering; Clustering algorithms; Data mining; Feedback; Nearest neighbor searches; Partitioning algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining, Fifth IEEE International Conference on
ISSN :
1550-4786
Print_ISBN :
0-7695-2278-5
Type :
conf
DOI :
10.1109/ICDM.2005.128
Filename :
1565759
Link To Document :
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