Title :
Recovering commit dependencies for selective code integration in software product lines
Author :
Dhaliwal, T. ; Khomh, Foutse ; Ying Zou ; Hassan, Ahmed E.
Author_Institution :
Dept. of Elec. & Comp. Eng., Queen´s Univ., Kingston, ON, Canada
Abstract :
In software product lines, multiple products of a software product family, share source code of common components. New features added to the common components of a software product family, are integrated into products following a selective code integration process. Selective code integration is a process in which developers pick the commits (i.e., code changes) related to a feature from one code branch and integrate them into another code branch. Developers often manually link the commits to the features to enable the selective integration of features. In current practice, not all dependent commits are always linked to features and developers might miss the unlinked commits during selective code integration. In this paper, we propose two grouping approaches that identify dependencies among commits and create groups of dependent commits that need to be integrated as a whole into a code branch. Our first approach is automatic and the other is developer-guided. Through a case study on data derived from a product line of mobile software applications, we show that our approaches can help to reduce by up to 94% integration failures caused by missing commit dependencies.
Keywords :
object-oriented programming; software engineering; source coding; automatic approach; code branch; commit dependency recovery; common components; developer-guided approach; grouping approaches; integration failures; mobile software applications; selective code integration process; selective feature integration; software product family; software product lines; source code sharing; Conferences; Educational institutions; Equations; Learning systems; Measurement; Software maintenance; Developer-guided Grouping; Product Line Development; Selective Code Integration;
Conference_Titel :
Software Maintenance (ICSM), 2012 28th IEEE International Conference on
Conference_Location :
Trento
Print_ISBN :
978-1-4673-2313-0
DOI :
10.1109/ICSM.2012.6405273