Title :
Memory Leak Dynamic Monitor Based On HOOK Technique
Author :
Qu, Binbin ; Shu, Jufang ; Huang, Yin ; Lu, Yansheng
Author_Institution :
Coll. of Comput. Sci. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
Memory leak can cause performance decrease or even breakdown of computer system. According to the unavailability of COM component, this paper analyses COM component´s memory leak mechanism, propose a testing architecture and provide a memory leak detection method based on HOOK technique. This method can locate functions which cause memory leak and get details of the leaking process. The experiment shows that the memory leak faults can be triggered and monitored effectively.
Keywords :
distributed object management; program testing; software architecture; software fault tolerance; storage management; system recovery; COM component; HOOK technique; computer system breakdown; memory leak detection; memory leak dynamic monitor; memory leak fault; software testing; testing architecture; Computer architecture; Computer bugs; Counting circuits; Data analysis; Electric breakdown; Information analysis; Leak detection; Monitoring; Runtime; Testing;
Conference_Titel :
Computational Intelligence and Software Engineering, 2009. CiSE 2009. International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4507-3
Electronic_ISBN :
978-1-4244-4507-3
DOI :
10.1109/CISE.2009.5366368