DocumentCode
2866677
Title
Comparison of 4.5 kV SiC JBS and Si PiN diodes for 4.5 kV Si IGBT anti-parallel diode applications
Author
Duong, Tam ; Hefner, Allen ; Hobart, Karl ; Ryu, Sei-Hyung ; Grider, David ; Berning, David ; Ortiz-Rodriguez, Jose M. ; Imhoff, Eugene ; Sherbondy, Jerry
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2011
fDate
6-11 March 2011
Firstpage
1057
Lastpage
1063
Abstract
A new 60 A, 4.5 kV SiC JBS diode is presented, and its performance is compared to a Si PiN diode used as the antiparallel diode for 4.5 kV Si IGBTs. The I-V, C-V, reverse recovery, and reverse leakage characteristics of both diode types are measured. The devices are also characterized as the anti-parallel diode for a 4.5 kV Si IGBT using a recently developed high-voltage, double-pulse switching test system. The results indicate that SiC JBS diodes reduce IGBT turn-on switching loses by about a factor of three in practical applications. Furthermore, the peak IGBT current at turn-on is typically reduced by a factor of six, resulting in substantially lower IGBT stress. Circuit simulator models for the 4.5 kV SiC JBS and Si PiN diodes are also developed and compared with measurements.
Keywords
Schottky barriers; Schottky diodes; insulated gate bipolar transistors; p-i-n diodes; power bipolar transistors; silicon; silicon compounds; IGBT anti-parallel diode; JBS diodes; Si; SiC; current 60 A; double-pulse switching test system; insulated gate bipolar transistors; junction barrier Schottky; p-i-n diodes; reverse leakage; reverse recovery; turn-on switching loss; voltage 4.5 kV; Current measurement; Insulated gate bipolar transistors; PIN photodiodes; Schottky diodes; Silicon; Silicon carbide; Solids; Junction Barrier Schottky (JBS); Silicon carbide (SiC); high-frequency; hybrid halfbridge module; medium-voltage; power systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location
Fort Worth, TX
ISSN
1048-2334
Print_ISBN
978-1-4244-8084-5
Type
conf
DOI
10.1109/APEC.2011.5744725
Filename
5744725
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