Title :
Layout and test design of synchronous LSI circuits
Author :
Mulder, C. ; Niessen, Christopher ; Wijnhoven, Rob
Author_Institution :
Philips Research Labs., Eindhoven, Netherlands
Abstract :
A design system for customized low-power digital dynamic circuitry will be described. The logic design process uses synchronous logic. The layout has a row organization which permits automatic layout design and automatic generation of accept-reject information.
Keywords :
Circuit simulation; Circuit testing; Clocks; Design automation; Integrated circuit interconnections; Laboratories; Large scale integration; Logic design; Logic testing; System testing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1979 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1979.1155969
