DocumentCode
2868059
Title
Lightweight Static Analysis for GUI Testing
Author
Arlt, S. ; Podelski, A. ; Bertolini, Clement ; Schaf, Martin ; Banerjee, Indradip ; Memon, Atif M.
Author_Institution
Albert-Ludwigs-Univ. Freiburg, Freiburg, Germany
fYear
2012
fDate
27-30 Nov. 2012
Firstpage
301
Lastpage
310
Abstract
GUI testing is an active research area. The open challenge is the judicious generation of event sequences (an event sequence encodes a user interaction). A major advance in this direction is the use of a black-box model to systematically generate event sequences that are executable on the GUI. The black-box model can be, e.g., an Event Flow Graph (EFG) or an Event Sequence Graph (ESG). In this paper we propose a new approach to select relevant event sequences among the event sequences generated by a black-box model. We express the relevance of an event sequence by a precisely defined dependency between a fixed number of events in the event sequence. Departing from a pure black-box approach we apply a static analysis to the byte code of the application. This allows us to infer a dependency graph, which we call Event Dependency Graph (EDG). We use the EDG together with a black-box model to construct a set of relevant event sequences among the executable ones. We have implemented our approach in a new tool. We evaluate the approach on four open source GUI applications. With the specific choice of a lightweight static analysis, the approach scales to large applications and, at the same time, leads to an informed selection of event sequences. Using our approach we are able to find previously undetected bugs.
Keywords
graph theory; graphical user interfaces; program diagnostics; program testing; sequences; EDG; EFG; ESG; GUI testing; black-box model; bytecode; event dependency graph; event flow graph; event sequence graph; event sequences generation; lightweight static analysis; open source GUI applications; undetected bugs; Computer bugs; Educational institutions; Flow graphs; Graphical user interfaces; Java; Testing; Transforms; Black-box Testing; GUI Testing; Static Analysis; Test Automation;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering (ISSRE), 2012 IEEE 23rd International Symposium on
Conference_Location
Dallas, TX
ISSN
1071-9458
Print_ISBN
978-1-4673-4638-2
Type
conf
DOI
10.1109/ISSRE.2012.25
Filename
6405378
Link To Document