DocumentCode :
2868461
Title :
Efficient signature-based fault diagnosis using variable size windows
Author :
Clouqueur, T. ; Saluja, Krishan Kumar
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI
fYear :
2001
fDate :
2001
Firstpage :
391
Lastpage :
396
Abstract :
A technique for signature based diagnosis using windows of different sizes is presented. It allows one to obtain increased diagnostic information from a given test at a lower cost, without additional hardware. Existing techniques that use signature based methods are limited by occurrences of aliasing that can lead to failure in the diagnosis process. The new approach proposed in this paper uses windows of different sizes based on the distribution of faults in a circuit and reduces the probability of aliasing in a window Signature analysis can then give reliable information about failing and non-failing vectors. The effectiveness of the proposed method is evaluated by experiments conducted on ISCAS benchmark circuits. The results show that the proposed method can improve the diagnostic resolution and can reduce the cost of diagnosis
Keywords :
automatic testing; built-in self test; fault diagnosis; integrated circuit testing; logic testing; ISCAS benchmark circuits; aliasing; circuit faults; cost of diagnosis; diagnostic information; diagnostic resolution; failing vectors; nonfailing vectors; signature-based fault diagnosis; variable size windows; Automatic testing; Circuit faults; Circuit testing; Content addressable storage; Costs; Dictionaries; Failure analysis; Fault diagnosis; Hardware; Information analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2001. Fourteenth International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
0-7695-0831-6
Type :
conf
DOI :
10.1109/ICVD.2001.902690
Filename :
902690
Link To Document :
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