On-Die Supply-Voltage Noise Sensor with Real-Time Sampling Mode for Low-Power Processor Applications

Author

Sato, Tomio ; Inoue, Akira ; Shiota, Tetsuyoshi ; Inoue, Takeru ; Kawabe, Yukihito ; Hashimoto, Tetsutaro ; Imamura, Toshifumi ; Murasaka, Yoshitaka ; Nagata, Makoto ; Iwata, Atsushi

Author_Institution

Fujitsu Labs., Kawasaki

fYear

2007

fDate

11-15 Feb. 2007

Firstpage

290

Lastpage

603

Abstract

A real-time on-die noise sensor continuously detects up to 100 noise events per second without disturbing processor operations, using a 400kb/s serial interface. The noise sensor uses histogram counters and variable detection windows. The sensor measures periodic and single-events in real time. The noise sensor is implemented in a 90nm CMOS testchip.

Keywords

CMOS integrated circuits; electric noise measurement; electric sensing devices; integrated circuit noise; low-power electronics; microprocessor chips; peripheral interfaces; 400 kbit/s; CMOS testchip; histogram counters; low-power processor applications; on-die supply-voltage noise sensor; real-time on-die noise sensor; real-time sampling; serial interface; variable detection windows; Bandwidth; Circuit noise; Energy consumption; Frequency; Low-frequency noise; Noise figure; Sampling methods; Testing; Variable structure systems; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International

Conference_Location

San Francisco, CA

ISSN

0193-6530

Print_ISBN

1-4244-0853-9

Electronic_ISBN

0193-6530

Type

conf

DOI

10.1109/ISSCC.2007.373408

Filename

4242379