DocumentCode

2869397

Title

Practical visual inspection techniques - optics, micro-electronics and advanced software technology

Author

Hata, Seiji

Author_Institution

Kagawa University

Volume

4

fYear

2000

fDate

3-7 Sept. 2000

Firstpage

114

Lastpage

117

Keywords

Cameras; Charge coupled devices; Charge-coupled image sensors; Dynamic range; Image processing; Inspection; Optical devices; Optical imaging; Optical sensors; Shape;

fLanguage

English

Publisher

ieee

Conference_Titel

Pattern Recognition, 2000. Proceedings. 15th International Conference on

Conference_Location

Barcelona, Spain

ISSN

1051-4651

Print_ISBN

0-7695-0750-6

Type

conf

DOI

10.1109/ICPR.2000.902877

Filename

902877