Title :
CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS
Author :
Rodríguez-Montañés, R. ; Segura, J.A. ; Champac, V.H. ; Figueras, J. ; Rubio, J.A.
Keywords :
Bridge circuits; CMOS logic circuits; CMOS process; Circuit faults; Circuit testing; Inverters; Logic testing; MOSFETs; Semiconductor device modeling; Voltage;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519713
