DocumentCode
2873601
Title
Post-Synthesis Circuit Techniques for Runtime Leakage Reduction
Author
Potluri, Seetal ; Chandrachoodan, Nitin ; Kamakoti, V.
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India
fYear
2011
fDate
4-6 July 2011
Firstpage
319
Lastpage
320
Abstract
We consider the problem of reducing active mode leakage power by modifying the post-synthesis net lists of combinational logic blocks. The stacking effect is used to reduce leakage power, but instead of a separate signal one of the inputs to the gate itself is used. The approach is studied on multiplier blocks. It is found that a significant number of nets have high probabilities of being constant at 0 or 1. In specific applications such as those having high peak to average ratio, like audio and other signal processing applications, this effect is more pronounced. We show how these signals can be used to put gates to sleep, thus saving significant leakage power.
Keywords
logic circuits; combinational logic blocks; post-synthesis circuit techniques; post-synthesis netlists; reducing active mode leakage power; runtime leakage reduction; Clocks; Delay; Integrated circuit modeling; Logic gates; Runtime; Stacking; Very large scale integration; Gate length biasing; Low Power; Post Synthesis; Runtime Leakage; Transistor Stacking Effect;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
Conference_Location
Chennai
ISSN
2159-3469
Print_ISBN
978-1-4577-0803-9
Electronic_ISBN
2159-3469
Type
conf
DOI
10.1109/ISVLSI.2011.24
Filename
5992506
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