• DocumentCode
    2873601
  • Title

    Post-Synthesis Circuit Techniques for Runtime Leakage Reduction

  • Author

    Potluri, Seetal ; Chandrachoodan, Nitin ; Kamakoti, V.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India
  • fYear
    2011
  • fDate
    4-6 July 2011
  • Firstpage
    319
  • Lastpage
    320
  • Abstract
    We consider the problem of reducing active mode leakage power by modifying the post-synthesis net lists of combinational logic blocks. The stacking effect is used to reduce leakage power, but instead of a separate signal one of the inputs to the gate itself is used. The approach is studied on multiplier blocks. It is found that a significant number of nets have high probabilities of being constant at 0 or 1. In specific applications such as those having high peak to average ratio, like audio and other signal processing applications, this effect is more pronounced. We show how these signals can be used to put gates to sleep, thus saving significant leakage power.
  • Keywords
    logic circuits; combinational logic blocks; post-synthesis circuit techniques; post-synthesis netlists; reducing active mode leakage power; runtime leakage reduction; Clocks; Delay; Integrated circuit modeling; Logic gates; Runtime; Stacking; Very large scale integration; Gate length biasing; Low Power; Post Synthesis; Runtime Leakage; Transistor Stacking Effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Chennai
  • ISSN
    2159-3469
  • Print_ISBN
    978-1-4577-0803-9
  • Electronic_ISBN
    2159-3469
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2011.24
  • Filename
    5992506