DocumentCode
2876707
Title
Assembly and Application Specific Methodology to Determine Accelerated Temperature Cycling Requirements for Pb-free Solder Joint Reliability
Author
Zhang, Ron
Author_Institution
Sun Microsyst., Sunnyvale
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
124
Lastpage
128
Abstract
An assembly-and application-specific methodology is proposed to address the issue of accelerated temperature cycling test requirements for solder joint reliability. This is accomplished by first determining the amount of solder damage that is expected to accumulate in the field over a specified period of time from power cycles (both on/off cycles and mini cycles), and then designing ATC tests to generate the equivalent amount of damage. By equating the damage from the field to that from the tests, the number of ATC cycles can be determined. A step by step procedure is provided to guide the designer in the initial concept stage to design for reliability. An example is provided to highlight the differences between the proposed methodology and traditional correlation models.
Keywords
integrated circuit bonding; integrated circuit design; integrated circuit reliability; integrated circuit testing; life testing; solders; ATC tests; Pb-free solder joint reliability; accelerated temperature cycling test; application-specific methodology; assembly-specific methodology; design for reliability; solder damage; Acceleration; Assembly systems; Life estimation; Materials testing; Power dissipation; Power generation; Qualifications; Soldering; Sun; Temperature distribution; Pb-free solder joints; accelerated temperature cycling; equivalent damage; power cycling; reliability methodology; test standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373786
Filename
4249872
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