• DocumentCode
    2876707
  • Title

    Assembly and Application Specific Methodology to Determine Accelerated Temperature Cycling Requirements for Pb-free Solder Joint Reliability

  • Author

    Zhang, Ron

  • Author_Institution
    Sun Microsyst., Sunnyvale
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    124
  • Lastpage
    128
  • Abstract
    An assembly-and application-specific methodology is proposed to address the issue of accelerated temperature cycling test requirements for solder joint reliability. This is accomplished by first determining the amount of solder damage that is expected to accumulate in the field over a specified period of time from power cycles (both on/off cycles and mini cycles), and then designing ATC tests to generate the equivalent amount of damage. By equating the damage from the field to that from the tests, the number of ATC cycles can be determined. A step by step procedure is provided to guide the designer in the initial concept stage to design for reliability. An example is provided to highlight the differences between the proposed methodology and traditional correlation models.
  • Keywords
    integrated circuit bonding; integrated circuit design; integrated circuit reliability; integrated circuit testing; life testing; solders; ATC tests; Pb-free solder joint reliability; accelerated temperature cycling test; application-specific methodology; assembly-specific methodology; design for reliability; solder damage; Acceleration; Assembly systems; Life estimation; Materials testing; Power dissipation; Power generation; Qualifications; Soldering; Sun; Temperature distribution; Pb-free solder joints; accelerated temperature cycling; equivalent damage; power cycling; reliability methodology; test standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373786
  • Filename
    4249872