Title :
Test Propagation Through Modules and Circuits
Author :
Murray, Brian T. ; Hayes, John P.
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Computer science; Design for testability; High level synthesis; Laboratories; Libraries; Microprocessors; VHF circuits;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519740
