• DocumentCode
    2877366
  • Title

    Gate-Delay-Fault Testability Properties of Multiplexor-Based Networks

  • Author

    Ashar, Pranav ; Devadas, Srinivas ; Keutzer, Kurt

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    887
  • Keywords
    Binary decision diagrams; Boolean functions; Circuit faults; Circuit synthesis; Circuit testing; Data structures; Logic testing; Network synthesis; Redundancy; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519755
  • Filename
    519755
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2877366