DocumentCode :
2877739
Title :
PROGRAMMING FOR PARALLEL PATTERN GENERATORS
Author :
Kanzaki, M. ; Ishida, M.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
1061
Keywords :
Circuit testing; Computer languages; Hardware; Integrated circuit testing; Parallel programming; Random access memory; Read-write memory; Software design; System testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519775
Filename :
519775
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2877739