Title :
Novel technique to remove measurement noise generated by pinhole diffraction phenomenon
Author :
Youk, Youngchun ; Kim, Dug Young
Author_Institution :
Dept. of Inf. & Commun., Gwangju Inst. of Sci. & Technol., Gwangju
Abstract :
We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.
Keywords :
diffraction; noise measurement; refractive index measurement; scanning electron microscopy; confocal microscopy; measurement noise removal; pinhole diffraction; refractive index measurement; Detectors; Noise generators; Noise measurement; Optical diffraction; Optical microscopy; Optical noise; Optical refraction; Optical variables control; Optical waveguides; Refractive index; (180.1790) Confocal microscopy; (290.3030) Index measurements;
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
Electronic_ISBN :
978-1-55752-813-1
DOI :
10.1109/CLEO.2006.4628660
