Title :
Receive diversity for mobile OFDM systems
Author :
Hutter, A.A. ; Hammerschmidt, J.S. ; de Carvalho, E. ; Cioffi, J.M.
Author_Institution :
Inst. for Integrated Circuits, Tech. Univ. Munchen, Germany
Abstract :
We investigate receive diversity for OFDM-based broadband communication systems. We consider the use of multiple antennas to combat time-selective fading and OFDM transmission in combination with an appropriate guard interval to suppress intersymbol interference. The receive diversity scheme is located in the frequency-domain and we derive different linear estimators, hereafter referred to as diversity equalizers. We show that the carrier-based solution for the optimum linear MMSE estimator-which is the least complex solution that maximizes the overall SNR is the well known maximum ratio combiner (MRC). Furthermore, we present a performance analysis for the proposed diversity equalizers and compare theoretical results to a simulated system which uses channel state information for MRC
Keywords :
OFDM modulation; broadband networks; diversity reception; equalisers; frequency-domain analysis; interference suppression; intersymbol interference; land mobile radio; least mean squares methods; optimisation; parameter estimation; radio networks; receiving antennas; ISI suppression; MRC; SNR; broadband communication systems; carrier-based solution; channel state information; diversity equalizers; frequency-domain; guard interval; intersymbol interference suppression; linear estimators; maximum ratio combiner; mobile OFDM systems; multiple antennas; optimum linear MMSE estimator; performance analysis; receive diversity; simulated system; time-selective fading; unbiased minimum mean squared error estimation; zero forcing equalization; Broadband communication; Communication systems; Equalizers; Fading; Frequency domain analysis; Frequency estimation; Intersymbol interference; OFDM; Performance analysis; Transmitting antennas;
Conference_Titel :
Wireless Communications and Networking Confernce, 2000. WCNC. 2000 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-6596-8
DOI :
10.1109/WCNC.2000.903941