DocumentCode
2880666
Title
Evaluation of High Compliant Low Ag Solder Alloys on OSP as a Drop Solution for the 2nd Level Pb-Free Interconnection
Author
Kim, Dongwook ; Suh, Daewoong ; Millard, Thomas ; Kim, Hyunchul ; Kumar, Chetan ; Zhu, Mark ; Xu, Youren
Author_Institution
Intel Corp., Folsom
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
1614
Lastpage
1619
Abstract
Low Ag content alloys (Sn1.2Ag0.5Cu) with or without Ni doping on Cu organic solderability preservative (OSP) were evaluated as a high G drop solution to Sn4.0Ag0.5Cu with Ni/Au surface finish for the mobile electronics. Three key points are studied in this paper. First, the effect of increasing compliance of alloy was studied. High compliance and high plasticity energy dissipation effectively toughened the crack tip and prolonged the time to reach the critical stress for the fracture. Second, the effect of Ni doping to the interfacial phase formation was studied. The substitution of Ni for Cu effectively suppresses growth kinetics of intermetallic compounds (IMCs) and makes the IMC layer thin. Finally, reliability tests were conducted to evaluate thermomechanical and high G drop resistance of low Ag alloys with Cu OSP surface finish. Overall, low Ag content alloy systems enhance high G shock resistance significantly without sacrificing thermomechanical performance.
Keywords
copper alloys; silver alloys; solders; tin alloys; Pb-free interconnection; SnAgCu; growth kinetics; interfacial phase formation; intermetallic compounds; low Ag content solder alloys; organic solderability preservative; plasticity energy dissipation; reliability tests; thermomechanical performance; Copper alloys; Doping; Energy dissipation; Gold alloys; Nickel alloys; Surface cracks; Surface finishing; Surface resistance; Thermal resistance; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.374010
Filename
4250096
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