• DocumentCode
    2880666
  • Title

    Evaluation of High Compliant Low Ag Solder Alloys on OSP as a Drop Solution for the 2nd Level Pb-Free Interconnection

  • Author

    Kim, Dongwook ; Suh, Daewoong ; Millard, Thomas ; Kim, Hyunchul ; Kumar, Chetan ; Zhu, Mark ; Xu, Youren

  • Author_Institution
    Intel Corp., Folsom
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    1614
  • Lastpage
    1619
  • Abstract
    Low Ag content alloys (Sn1.2Ag0.5Cu) with or without Ni doping on Cu organic solderability preservative (OSP) were evaluated as a high G drop solution to Sn4.0Ag0.5Cu with Ni/Au surface finish for the mobile electronics. Three key points are studied in this paper. First, the effect of increasing compliance of alloy was studied. High compliance and high plasticity energy dissipation effectively toughened the crack tip and prolonged the time to reach the critical stress for the fracture. Second, the effect of Ni doping to the interfacial phase formation was studied. The substitution of Ni for Cu effectively suppresses growth kinetics of intermetallic compounds (IMCs) and makes the IMC layer thin. Finally, reliability tests were conducted to evaluate thermomechanical and high G drop resistance of low Ag alloys with Cu OSP surface finish. Overall, low Ag content alloy systems enhance high G shock resistance significantly without sacrificing thermomechanical performance.
  • Keywords
    copper alloys; silver alloys; solders; tin alloys; Pb-free interconnection; SnAgCu; growth kinetics; interfacial phase formation; intermetallic compounds; low Ag content solder alloys; organic solderability preservative; plasticity energy dissipation; reliability tests; thermomechanical performance; Copper alloys; Doping; Energy dissipation; Gold alloys; Nickel alloys; Surface cracks; Surface finishing; Surface resistance; Thermal resistance; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.374010
  • Filename
    4250096