• DocumentCode
    2880751
  • Title

    Physical limits of VLSI DRAMs

  • Author

    Lewyn, L. ; Meindl, J.

  • Author_Institution
    Stanford University, Stanford, CA
  • Volume
    XXVII
  • fYear
    1984
  • fDate
    22-24 Feb. 1984
  • Firstpage
    160
  • Lastpage
    161
  • Abstract
    This paper will report on a study disclosing real constraints affecting DRAM limits, including soft errors, cosmic rays, α particles, noise limitations and critical fields. Density limits of 16Mb are projected.
  • Keywords
    Art; Circuit noise; Cosmic rays; Dielectrics; Insulation; Low voltage; Noise cancellation; Power dissipation; Random access memory; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1984.1156713
  • Filename
    1156713
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2880751