Title :
A 17ns 64K CMOS RAM with a schmitt trigger sense amplifier
Author :
Ochii, K. ; Yasuda, Hozumi ; Kobayashi, Kaoru ; Kondoh, T. ; Masuoka, Fujio
Author_Institution :
Toshiba Corp., Kawasaki, Japan
Abstract :
This paper will describe a CMOS SRAM using a four-transistor cross-coupled flip-flop memory cell with a high resistivity load composed of the second poly-Si. Cell is 12.5μm

m. Die is 3.86mm×6.99mm that can De packaged in a 300 mil wide 22 pin plastic DIP.
Keywords :
Aluminum; Decoding; Delay lines; Electronics packaging; Fluctuations; Impurities; Manufacturing; Power dissipation; Random access memory; Trigger circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1985 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1985.1156745