Abstract :
The following topics are dealt with: RF front-end; high performance circuit design; high performance SoC architecture; DVB baseband techniques; digital signal processing architecture; data converters; low power design and optimization; SoC design, verification and application; deep submicron era testing and diagnostics; high speed analog circuits; digital timing module; regulators and equalizers; electronic design automation; design for testability; analog, mixed-signal and RF design
Keywords :
VLSI; analogue integrated circuits; circuit optimisation; convertors; design for testability; digital signal processing chips; electronic design automation; equalisers; high-speed integrated circuits; integrated circuit design; integrated circuit testing; low-power electronics; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; system-on-chip; DVB baseband techniques; RF front-end; SoC architecture; VLSI; analog design; data converters; deep submicron era diagnostics; deep submicron era testing; design for testability; digital signal processing architecture; digital timing module; electronic design automation; equalizers; high performance circuit design; high speed analog circuits; low power design; mixed-signal design; optimization; radiofrequency design; regulators; system-on-chip;
Conference_Titel :
VLSI Design, Automation and Test, 2006 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
1-4244-0179-8
DOI :
10.1109/VDAT.2006.258102
