Title :
The application of microscopy to dielectric mouldings
Author :
Wolfe, S.V. ; Chan, H.K.C.
Author_Institution :
STC Submarine Syst., London, UK
Abstract :
As submarine cable systems are designed for high reliability, manufacturing processes and screening techniques have been developed to a very high standard to eliminate defects and inhomogeneities detrimental to short and long term performance. This has been achieved by an understanding of the factors giving rise to electrical weaknesses and thereby controlling moulding processes accordingly. This presentation describes the results of a programme of work aimed at understanding DC breakdown and ageing behaviour of DC insulation in order to achieve high reliability at minimised cost
Keywords :
ageing; cable insulation; cable testing; electric breakdown; insulation testing; submarine cables; DC breakdown; DC insulation; ageing; defects; dielectric mouldings; electrical weaknesses; inhomogeneities; microscopy; reliability; submarine cable systems;
Conference_Titel :
Characterisation of Dielectric Materials: a Review, IEE Colloquium on
Conference_Location :
London