DocumentCode :
2882650
Title :
[Opinion]
fYear :
2006
fDate :
26-28 April 2006
Firstpage :
1
Lastpage :
1
Abstract :
Presents the introductory welcome message from the conference proceedings. May include the conference officers´ congratulations to all involved with the conference event and publication of the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test, 2006 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
1-4244-0179-8
Type :
conf
DOI :
10.1109/VDAT.2006.258104
Filename :
4027476
Link To Document :
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