73ps si bipolar ECL circuits

Author

Tang, Dong ; Guann-Pyng Li ; Ching-Te Chuang ; Danner, Daniel ; Ketchen, M. ; Mauer, J. ; Smyth, M. ; Manny, M. ; Cressler, John ; Ginsberg, B. ; Petrillo, E. ; Tak Ning ; Chih-Chun Hu ; Haksong Pak

Author_Institution

IBM Research Center, Yorktown Heights, NY, USA

Volume

XXIX

fYear

1986

fDate

19-21 Feb. 1986

Firstpage

104

Lastpage

105

Keywords

Bipolar transistors; Delay; Electric breakdown; Electrodes; Isolation technology; Logic circuits; Resistors; Ring oscillators; Silicon; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1986 IEEE International

Conference_Location

Anaheim, CA, USA

Type

DOI

10.1109/ISSCC.1986.1156926

Filename

1156926

Link To Document