DocumentCode :
2884700
Title :
Low cost fabrication and testing of high isolation RF MEMS switches
Author :
Joshi, Abhay B. ; Gangal, S.A. ; Gandhi, R. ; Natarajan, K. ; Bodas, Dhananjay
Author_Institution :
Dept of Electronic Science, University of Pune, India
fYear :
2012
fDate :
7-10 March 2012
Firstpage :
189
Lastpage :
192
Abstract :
RF MEMS switches are key components in lowpower communication system. The present paper reports fabrication of MEMS based series and shunt switches for actuation voltage in the range of 30–50V. Focusing on low cost fabrication approach, Aluminum was chosen as a cost effective alternative for fabrication of transmission line and structural beam. The switches were designed for higher isolation of >25dB and low insertion loss of <0.5dB. The shunt and series switches were investigated for the frequency range of 1–20 GHz. The shunt switch shows an insertion loss of 0.5db and isolation of −28dB @ 20GHz and the series switch shows an insertion loss of 0.7db and isolation of −27dB @ 20GHz. The measured actuation voltage was 30V for shunt switch and 42V for series switch.
Keywords :
Aluminum; RF MEMS; Switches; low cost fabrication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics and Technology of Sensors (ISPTS), 2012 1st International Symposium on
Conference_Location :
Pune, India
Print_ISBN :
978-1-4673-1040-6
Type :
conf
DOI :
10.1109/ISPTS.2012.6260917
Filename :
6260917
Link To Document :
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