DocumentCode :
2884778
Title :
Three dimensional CMOS integrated circuits on large grain polysilicon films
Author :
Chan, V.W.C. ; Chan, P.C.H. ; Chan, M.
Author_Institution :
Hong Kong Univ. of Sci. & Technol., Clear Water Bay, China
fYear :
2000
fDate :
10-13 Dec. 2000
Firstpage :
161
Lastpage :
164
Abstract :
In this paper, we report high performance three-dimensional (3-D) CMOS integrated circuits. The first layer of transistors is fabricated on Silicon-on-Insulator (SOI) and second layer is fabricated on large-grain polysilicon-on-insulator (LPSOI) film, with oxide as the interlayer dielectric. The LPSOI film is formed by the re-crystallization of amorphous silicon through metal-induced lateral crystallization (MILC) at an elevated temperature. Compared with the conventional 2-D CMOS SOI low-voltage circuit, 3D circuit shows significant reduction in circuit area, shorter propagation delay and lower dynamic power consumption.
Keywords :
CMOS integrated circuits; elemental semiconductors; grain size; low-power electronics; recrystallisation; semiconductor thin films; silicon; silicon-on-insulator; LPSOI; SOI; Si; circuit area; large-grain polysilicon film; low-voltage circuit; metal-induced lateral crystallization; propagation delay; recrystallization; three-dimensional CMOS integrated circuit; Amorphous silicon; CMOS integrated circuits; CMOS technology; Crystallization; Energy consumption; Grain size; MOSFETs; Semiconductor films; Silicon on insulator technology; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-6438-4
Type :
conf
DOI :
10.1109/IEDM.2000.904283
Filename :
904283
Link To Document :
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