Title :
An effective algorithm for test application
Author :
Zijian, Zhou ; Junliang, Chen
Author_Institution :
Beijing Univ. of Posts & Telecommun., China
Abstract :
DTS (dynamic test sequence) algorithm the simplification and extension of adaptive experiment, is developed as an engineering approach for locating faults more efficiently at PCB functional testing level. The application in a practical ATE system is presented in detail. Comparison with the arbitrary test application shows its advantages
Keywords :
automatic test equipment; dynamic testing; printed circuit testing; ATE system; DTS; PCB functional testing level; adaptive experiment; dynamic test sequence; fault location; Abstracts; Circuit faults; Circuit testing; Costs; Dictionaries; Fault location; Flip-flops; Kernel; Telecommunications; Time measurement;
Conference_Titel :
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CICCAS.1991.184444
