Title :
Impact of Transitor Matching on Features of Digital Circuit Blocks
Author :
Schaper, U. ; Kodytek, T. ; Kamp, W. ; Künemund, R.
Author_Institution :
Infineon Technol. AG, Neubiberg
Abstract :
Digital circuit blocks are extracted from full custom digital circuits as units for test structures. The test structures are suited for a statistical evaluation of circuit features like the pre-charge of node voltages of fast decision circuits. A statistical evaluation is needed to account for process variations. The circuit characterization results allow a comparison with statistical device models. Circuit performance is often guaranteed by adding a constant value to a figure of merit as a margin. The constant margin procedure for the circuit performance can be replaced by realistic margins applying the characterization results.
Keywords :
CMOS digital integrated circuits; field effect transistors; integrated circuit design; integrated circuit testing; CMOS circuits; circuit characterization; circuit performance; circuit statistical evaluation; constant margin procedure; digital circuit blocks; fast decision circuits; nFET; node voltage; pFET; parallel test structure units; serial test structure units; statistical device models; transistor matching; Decision support systems; Digital circuits; Fiber reinforced plastics; Microelectronics; Quadratic programming; Testing;
Conference_Titel :
Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on
Conference_Location :
Tokyo
Print_ISBN :
1-4244-0781-8
Electronic_ISBN :
1-4244-0781-8
DOI :
10.1109/ICMTS.2007.374459
