Title :
Measurement uncertainties due to non-ideal calibration standards for unknown thru calibration
Author :
Lenk, Friedrich ; Doerner, Ralf ; Kurpas, Paul ; Rumiantsev, Andrej
Author_Institution :
Hochschule Lausitz (FH), Senftenberg, Germany
Abstract :
In this paper an analytical derivation of vector network analyzer (VNA) measurement uncertainties due to non-ideal calibration standards for unknown thru calibration (UOSM or UXYZ) is presented. Simple equations for the sensitivity coefficients are obtained. This allows a deep insight into the error propagation mechanism as well as an easy implementation into calibration software.
Keywords :
calibration; measurement standards; measurement uncertainty; network analysers; UOSM; UXYZ; VNA; error propagation mechanism; measurement uncertainty; nonideal calibration standard; sensitivity coefficient; unknown thru calibration; vector network analyzer; Adaptation models; Calibration; Numerical models; Scattering parameters; Standards; System-on-chip; Calibration; error analysis; measurement uncertainty; scattering parameters; sensitivity coefficients;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
DOI :
10.1109/ARFTG.2013.6579057
