DocumentCode
2886933
Title
Statistical design of class E tuned power amplifier
Author
Ming, Qu ; Aiguo, Xie
Author_Institution
Dept. of Electron. Eng., Shanghai Jiao Tong Univ., China
fYear
1991
fDate
16-17 Jun 1991
Firstpage
746
Abstract
Because of the existence of unavoidable tolerances in manufacturing, high yield is desirable in mass production. In this paper, the authors focus on the statistical design of class E tuned power amplifier to improve the yield. The results have shown that yield can be improved to a satisfactory extent by statistical design centering. Detailed design data tables are given in the paper
Keywords
electronic equipment manufacture; power amplifiers; statistical analysis; tuning; class E; manufacturing; statistical design centering; tuned power amplifier; yield improvement; Circuit noise; Circuit optimization; Design methodology; Equivalent circuits; High power amplifiers; Manufacturing; Mass production; Power amplifiers; Signal to noise ratio; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/CICCAS.1991.184467
Filename
184467
Link To Document