Title :
Statistical design of class E tuned power amplifier
Author :
Ming, Qu ; Aiguo, Xie
Author_Institution :
Dept. of Electron. Eng., Shanghai Jiao Tong Univ., China
Abstract :
Because of the existence of unavoidable tolerances in manufacturing, high yield is desirable in mass production. In this paper, the authors focus on the statistical design of class E tuned power amplifier to improve the yield. The results have shown that yield can be improved to a satisfactory extent by statistical design centering. Detailed design data tables are given in the paper
Keywords :
electronic equipment manufacture; power amplifiers; statistical analysis; tuning; class E; manufacturing; statistical design centering; tuned power amplifier; yield improvement; Circuit noise; Circuit optimization; Design methodology; Equivalent circuits; High power amplifiers; Manufacturing; Mass production; Power amplifiers; Signal to noise ratio; Switches;
Conference_Titel :
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CICCAS.1991.184467
