Title :
A circuit design methodology based on statistical tolerance optimization
Author :
Liu, P.C.K. ; Li, K.C.
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Kowloon, Hong Kong
Abstract :
A statistical circuit/system design method which combines the cost of component tolerance, cost of repair and cost of throw-away as the objective function for minimization is proposed. This method automatically produces the optimal manufacture yield and optimal tolerances. It does not require repeated Monte Carlo simulations and does not depend on convexity of the acceptable region. It can also be applied to cases when the circuit/system performances can only be obtained by measurements and not by simulations
Keywords :
network synthesis; optimisation; statistical analysis; circuit design methodology; component tolerance; minimization; objective function; optimal manufacture yield; optimal tolerances; repair cost; statistical tolerance optimization; Circuit synthesis; Cost function; Design optimization; Fluctuations; Frequency; Low pass filters; Minimax techniques; Optimization methods; Performance evaluation; Sampling methods;
Conference_Titel :
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CICCAS.1991.184469
