Accurate Inductance De-embedding Technique for Scalable Inductor Models

Scalable models for circuit design components such as inductors are a requirement for state of the art design environments. Accurate Spice-level modeling requires physical based models and an accurate RF characterization process. In this paper we present a semi-analytical de-embedding technique that accounts for the magnetic coupling between test structure feed-lines and device under test (DUT). The method significantly improves the result of extracted inductance and enables broadband frequency characterization of square and octagonal inductors in single-ended and differential configuration over a large space of geometries.