Title :
A unified model for integrated resistors in CMOS technologies
Author :
Aureli, I. ; Ventrice, D. ; Codegoni, C. ; Fantini, P.
Author_Institution :
NVMTD-FTM, Agrate Brianza
Abstract :
In the present work we present a compact model, oriented to the SPICE-like simulation, that pictures the electrical behavior of integrated resistors fabricated in CMOS technologies. The model accounts for the main electrical features of integrated resistors such as the depletion effects, the head resistance contribution, the velocity saturation and the temperature behavior also including possible self-heating phenomena. It has been validated by considering a wide fan of integrated resistors: n-and p-type, diffused, poly silicon devices. It could be a precious tool for design in analog application, where a very accurate description of the electrical behavior is needed.
Keywords :
CMOS integrated circuits; heating; integrated circuit modelling; resistors; CMOS technology; depletion effects; electrical behavior; head resistance contribution; integrated resistors; self-heating phenomena; temperature behavior; velocity saturation; Area measurement; CMOS technology; Circuits; Electric resistance; Electrical resistance measurement; Immune system; Resistors; Semiconductor device modeling; Temperature; Testing; compact modeling; integrated resistor; narrow effects; self heating; temperature modeling;
Conference_Titel :
Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on
Conference_Location :
Tokyo
Print_ISBN :
1-4244-0781-8
Electronic_ISBN :
1-4244-0781-8
DOI :
10.1109/ICMTS.2007.374497