• DocumentCode
    2887745
  • Title

    Damp heat induced physical aging of PV encapsulation materials

  • Author

    Oreski, Gernot ; Wallner, Gernot M.

  • Author_Institution
    Polymer Competence Center Leoben GmbH, Leoben, Austria
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Apart from its chemical structure, mechanical properties of polymers depend mainly on polymer morphology, which is determined by the processing conditions. Exposure of the materials at elevated temperatures lead to changes in polymer morphology. The main objective of this study was to investigate the change in thermo-mechanical properties of different encapsulation materials (EVA, Ionomer) after damp heat testing. Therefore the materials were exposed for 1000 h to three different temperature and humidity levels and the thermo-mechanical properties of unaged and aged materials were measured by dynamic mechanical analysis (DMA) and by differential scanning calorimetry (DSC). At temperatures below -20°C, EVA and Ionomer showed high elastic modulus values around 1000 MPa, which decrease significantly to below 10 MPa at temperatures higher than 20°C. All films showed an increase in elastic modulus values over the whole temperature range due to damp heat exposure. Using DSC, recrystallization was found to be the dominant physical aging mechanism. Higher temperature levels during exposure caused greater changes in the polymer morphology, which led to stiffening of the polymer. The significant increase in film stiffness under application relevant temperatures could cause some severe problems during the service life time of a PV module, starting with delamination and a reduced ability to withstand mismatches in thermal expansion and eventually cracking of the cell or the wiring.
  • Keywords
    ageing; chemical structure; differential scanning calorimetry; elastic moduli; encapsulation; humidity; polymer films; polymer structure; recrystallisation; solar cells; PV encapsulation material; chemical structure; damp heat exposure; damp heat testing; differential scanning calorimetry; dynamic mechanical analysis; elastic modulus; film stiffness; humidity level; physical aging; polymer morphology; recrystallization; temperature level; thermomechanical property; unaged material; Aging; Chemical processes; Encapsulation; Lead; Mechanical factors; Morphology; Organic light emitting diodes; Polymers; Temperature; Thermomechanical processes; durability testing; physical aging; solar cell encapsulants;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501297
  • Filename
    5501297