DocumentCode
2887771
Title
Next generation IC technology for analog/digital VLSI
Author
Swanson, E.
Author_Institution
Crystal Semiconductor, Austin, TX, USA
Volume
XXX
fYear
1987
fDate
0-0 Feb. 1987
Firstpage
122
Lastpage
123
Abstract
The panel will discuss IC technology from the circuit designer´s perspective. Today´s analog VLSI devices are limited to about 20K transistors, a small fraction of the complexity available in scaled MOS processes. Analog VLSI complexity is limited by such factors as design risk, testability, design talent, supply voltage and scaled device performance. The most successful next-generation processes will balance all of these factors. The reward will be unprecedented monolithic performance for telecommunications, instrumentation and video applications.
Keywords
Analog integrated circuits; Application specific integrated circuits; CMOS process; CMOS technology; Circuit noise; Digital integrated circuits; Digital signal processing; Semiconductor device noise; Signal design; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1987 IEEE International
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ISSCC.1987.1157114
Filename
1157114
Link To Document