• DocumentCode
    2887771
  • Title

    Next generation IC technology for analog/digital VLSI

  • Author

    Swanson, E.

  • Author_Institution
    Crystal Semiconductor, Austin, TX, USA
  • Volume
    XXX
  • fYear
    1987
  • fDate
    0-0 Feb. 1987
  • Firstpage
    122
  • Lastpage
    123
  • Abstract
    The panel will discuss IC technology from the circuit designer´s perspective. Today´s analog VLSI devices are limited to about 20K transistors, a small fraction of the complexity available in scaled MOS processes. Analog VLSI complexity is limited by such factors as design risk, testability, design talent, supply voltage and scaled device performance. The most successful next-generation processes will balance all of these factors. The reward will be unprecedented monolithic performance for telecommunications, instrumentation and video applications.
  • Keywords
    Analog integrated circuits; Application specific integrated circuits; CMOS process; CMOS technology; Circuit noise; Digital integrated circuits; Digital signal processing; Semiconductor device noise; Signal design; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1987 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1987.1157114
  • Filename
    1157114