DocumentCode :
2888871
Title :
Q factors and resonant states of whispering-gallery-mode dielectric microdisk cavities for lasing applications
Author :
Zozoulenko, Igor ; Rahachou, Aliaksandr
Author_Institution :
Dept. of Sci. & Technol., Linkoping Univ., Sweden
fYear :
2005
fDate :
12-17 June 2005
Firstpage :
364
Abstract :
The effect of boundary roughness on the resonant states broadening of the optical whispering-gallery-mode microdisk lasing cavities is studied. A new, computationally effective, and numerically stable approach based on the scattering matrix (S-matrix) technique that is capable to deal with both arbitrary complex geometry and inhomogeneous refraction index inside the two-dimensional cavity is developed. In order to calculate the lifetime of the cavity modes (and, therefore their Q-factors) the Wigner-Smith time delay-matrix is computed which, in turn, is expressed in terms of the total scattering matrix. The developed algorithm to the calculation of resonant states and Q-values of nonideal microdisk cavities is applied.
Keywords :
Q-factor; S-matrix theory; microcavities; microcavity lasers; microdisc lasers; refractive index; resonant states; surface roughness; whispering gallery modes; Q factors; Wigner-Smith time delay-matrix; cavity mode lifetime; dielectric microdisk cavities; inhomogeneous refraction index; lasing cavities; resonant states; scattering matrix technique; whispering-gallery-mode; Argon; Chaos; Degradation; Dielectrics; Geometrical optics; Optical refraction; Optical scattering; Resonance; Rough surfaces; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 2005. EQEC '05. European
Print_ISBN :
0-7803-8973-5
Type :
conf
DOI :
10.1109/EQEC.2005.1567529
Filename :
1567529
Link To Document :
بازگشت