• DocumentCode
    2889518
  • Title

    Thermoelectrics enhanced air cooling limits and improvement techniques: Experimental and computational studies

  • Author

    Zhang, H.Y. ; Mui, Y.C. ; Refai-Ahmed, Gamal

  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The use of thermoelectric cooler (TEC) as enhanced air cooling technique for electronic generating devices has been of increasing interest. In this paper, experimental and computational studies of TEC enhanced air cooling limits are conducted. The experimental work was first conducted as a baseline study. The setup consisted of a fan-cooled heat sink, a thermal test board mounted with a test die, and a TEC of 50 mm × 50 mm. Experiments were run at different power inputs and operation currents. The cross-over power with TEC enhancement cases was identified to be about 62W under nonuniform die heating. The computational model was constructed according to the experimental study. The TEC module was modeled as heat conduction blocks with respective volumetric heat generations. Good agreement was achieved between computational predictions and measurements. The size of TEC module, which was seldom addressed in literature, was then varied to examine its effect on the junction temperature. Improving techniques such as the use of better TIM1 or indium TIM1 and liquid cooling technique are also discussed.
  • Keywords
    air conditioning; fans; heat conduction; heat sinks; thermoelectric power; air cooling limits; air cooling technique; electronic generating devices; fan-cooled heat sink; heat conduction blocks; thermoelectrics; volumetric heat generations; Computational modeling; Electronics cooling; Heat sinks; Heating; Indium; Liquid cooling; Temperature; Testing; Thermoelectric devices; Thermoelectricity; Thermoelectric cooler (TEC); computation; measurement; optimization; size effect; thermal enhancement; voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501388
  • Filename
    5501388